116 West, 23rd Street - Suite 500
New York, NY 10011 USA
Phone: 646 375 2452 - Fax: 866 978 2682
New York, NY 10011 USA
Phone: 646 375 2452 - Fax: 866 978 2682
QUANTA TECH is a AA OPTO-ELECTRONIC Company
A Bragg configuration gives a single first order output beam, which intensity is directly linked to the power of RF control signal, and which angle is directly linked to the RF frequency. By varying the frequency, the output laser beam angle is modified. A deflector is used to scan a laser beam over a range of angles, or to control with accuracy the output angle of the laser beam.
The main parameters to qualify a deflector are:
- 1.Deflection angle range and
- 2.Resolution.
The deflection angle range is the maximum angle variation of the laser beam : it is linked to the frequency range of the device. The resolution of a deflection is the number of distinct directions which can be addressed by the deflector : it is linked to the defle ct ion angle range and laser divergence. Two deflectors can be used in series and at right angles to give full two-dimensional scanning.
| Hight Resolution | ||||||||
|---|---|---|---|---|---|---|---|---|
| Model | Material | Wavelength | Aperture | Freq (Shift) MHz |
Polarization | Resolution TX∆F |
Efficiency %@Fc |
Deflexion Angle Range mrd |
| TeO2 | 350-1600* |
4.5x4.5 |
f(λ) | Linear | 320@633nm | >70 | 48 @633nm | |
| TeO2 | 350-1600* |
7.5x7.5 |
f(λ) | Linear | 500@633nm | >70 | 48 @633nm | |
| 2 Axis TeO2 | 350-1600* |
4.5x4.5 |
f(λ) | Linear | 300x300@633nm | >45 | 41x41@532nm | |
| 2 Axis TeO2 | 350-1600* |
7.5x7.5 |
f(λ) | Linear | 500x500@633nm | >45 | 41x41@532nm | |
| TeO2 | 400-450 |
0.5x17.5 |
230+/-60 | Linear | 500 | >50 | 11.4@400nm | |
| TeO2 | 450-670 |
0.5x17.5 |
230+/-60 | Linear | 500 | >50 | 15@532nm | |
 |
||||||||
| Low Resolution | ||||||||
|---|---|---|---|---|---|---|---|---|
| Model | Material | Wavelength | Aperture | Freq (Shift) MHz |
Polarization | Resolution TX∆F |
Efficiency %@Fc |
Deflexion Angle Range mrd |
| Fused Silica | 266-300 |
1x2 |
110+/-25 | Linear | 16 | > 60 | 2.2@266nm | |
| Fused Silica | 325-425 |
1x2 |
110+/-25 | Linear | 16 | > 60 | 3@355nm | |
| TeO2 | 400-442 |
0.5 x 2 |
225+/-25 | Linear/random | 23 | > 80 | 5.4 @458nm | |
| TeO2 | 450-700 |
0.5 x 2 |
200+/-50 | Linear/random | 47 | > 60 @633nm | 12.6@532nm | |
| TeO2 | 450-700 |
1 x 2 |
110+/-25 | Linear/random | 23 | > 60 @633nm | 6.3@532nm | |
| TeO2 | 450-700 |
1,5 x 2 |
110+/-25 | Linear/random | 23 | > 60 @633nm | 6.3@532nm | |
| TeO2 | 450-700 |
1 x 2 |
80+/-15 | Linear/random | 14 | > 65 | 3.8@532nm | |
| TeO2 | 450-700 |
1,5 x 2 |
80+/-15 | Linear/random | 14 | > 65 | 3.8@532nm | |
| TeO2 | 750-850 |
0.5 x 2 |
225+/-50 | Linear/random | 47 | > 60 | 18.6 @785nm | |
| TeO2 | 700-1100 |
1 x 2 |
200+/-20 | Linear/random | 19 | > 70 @785nm | 7.4 @800nm | |
| TeO2 | 700-1100 |
0.2 x 1 |
350+/-60 | Linear/random | 28 | > 60 | 22.8@800nm | |
| TeO2 | 700-1100 |
0.5 x 2 |
250+/-50 | Linear/random | 47 | > 60 | 19@800nm | |
| TeO2 | 700-1100 |
0.5 x 2 |
200+/-50 | Linear/random | 47 | > 60 @785nm | 19@800nm | |
| TeO2 | 700-1100 |
1 x 2 |
110+/-25 | Linear/random | 23 | > 60 @785nm | 9.5@800nm | |
| TeO2 | 700-1100 |
1,5 x 2 |
110+/-25 | Linear/random | 23 | > 60 @785nm | 9.5@800nm | |
| TeO2 | 700-1100 |
1 x 2 |
80+/-15 | Linear/random | 14 | > 70 @785nm | 5.7@800nm | |
| TeO2 | 700-1100 |
1,5 x 2 |
80+/-15 | Linear/random | 14 | > 70 @785nm | 5.7@800nm | |
| TeO2 | 980-1100 |
0,4 x 2 |
200+/-50 | Linear/random | 47 | > 35 | 25.3@1064nm | |
| TeO2 | 980-1100 |
0.2 x 1 |
200+/-50 | Linear/random | 23 | > 60 | 25.3@1064nm | |
| TeO2 | 980-1100 |
1 x 2 |
110+/-25 | Linear/random | 23 | > 55 | 12.6@1064nm | |
| TeO2 | 980-1100 |
1.5 x 2 |
110+/-15 | Linear/random | 14 | > 60 | 7.6@1064nm | |
| TeO2 | 980-1100 |
1 x 2 |
80+/-15 | Linear/random | 14 | > 65 | 7.6@1064nm | |
| TeO2 | 980-1100 |
1,5 x 2 |
80+/-15 | Linear/random | 14 | > 65 | 7.6@1064nm | |